Patent monitoring
Everything at one glance: bibliography, drawing and main claim.
For DE, EP, WO, US or JP, we continuously monitor publications of patent applications, patents and utility models from a specific subject area and supply you with a printout with all bibliographical details, the main claim and the main drawing (see sample). In this way, you have all the important data and the drawing on one page - the secure basis for professional patent policy. By agreement, we will be happy to conduct individual inventor monitoring, also in other countries.It is possible to build an in-house archive with the assistance of our database program.
RS3.e.
Profiting and profiling with PAVIS patent monitoring.
further topics:
Patent searchesLegal status of property rights
Retrospective patent searches
Patent monitoring
Electronic patent monitoring
The benefits to you
- One-stop search service.
- Fast analysis.
- Reduction in costs as complete copies are often unnecessary.
- Appropriate selection of relevant publications.
- No ongoing monitoring expenses, no dispatch costs.